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【英文标准名称】:Aerospaceseries-Cables,electrical,aircraftuse-Testmethods-Delaminationandblocking
【原文标准名称】:航空航天系列.航空器用电缆.试验方法.剥离和阻塞
【标准号】:BSEN3475-403-2002
【标准状态】:现行
【国别】:英国
【发布日期】:2002-02-04
【实施或试行日期】:2002-02-04
【发布单位】:英国标准学会(GB-BSI)
【起草单位】:BSI
【标准类型】:()
【标准水平】:()
【中文主题词】:航空航天运输;航空运输;航空器;阻塞;电缆;剥层;电缆线;导电体;电的;电线;多语种的;剥离;规范(验收);试验
【英文主题词】:Aerospacetransport;Airtransport;Aircraft;Blocking;Cables;Delamination;Electriccables;Electricconductors;Electrical;Electricalcords;Multilingual;Peeling;Specification(approval);Testing
【摘要】:TobereadinconjunctionwithEN3475-100
【中国标准分类号】:K13
【国际标准分类号】:49_060
【页数】:6P;A4
【正文语种】:英语


MIL-STD-883G, DEPARTMENT OF DEFENSE TEST METHOD STANDARD: MICROCIRCUITS (28 FEB 2006) [S/S BY MIL-STD-883H]., This standard establishes uniform methods, controls, and procedures for testing microelectronic devices suitable for use within Military and Aerospace electronic systems including basic environmental tests to determine resistance to deleterious effects of natural elements and conditions surrounding military and space operations; mechanical and electrical tests; workmanship and training procedures; and such other controls and constraints as have been deemed necessary to ensure a uniform level of quality and reliability suitable to the intended applications of those devices. For the purpose of this standard, the term "devices" includes such items as monolithic, multichip, film and hybrid microcircuits, microcircuit arrays, and the elements from which the circuits and arrays are formed. This standard is intended to apply only to microelectronic devices. The test methods, controls, and procedures described herein have been prepared to serve several purposes: a. To specify suitable conditions obtainable in the laboratory and at the device level which give test results equivalent to the actual service conditions existing in the field, and to obtain reproducibility of the results of tests. The tests described herein are not to be interpreted as an exact and conclusive representation of actual service operation in any one geographic or outer space location, since it is known that the only true test for operation in a specific application and location is an actual service test under the same conditions. b. To describe in one standard all of the test methods of a similar character which now appear in the various joint-services and NASA microelectronic device specifications, so that these methods may be kept uniform and thus result in conservation of equipment, manhours, and testing facilities. In achieving this objective, it is necessary to make each of the general tests adaptable to a broad range of devices. c. To provide for a level of uniformity of physical, electrical and environmental testing; manufacturing controls and workmanship; and materials to ensure consistent quality and reliability among all devices screened in accordance with this standard.